专利摘要:
The invention relates to a method for setting an effective resolution of an output signal in an incremental delta-sigma-analog-digital conversion by means of an incremental delta-sigma-analog-digital converter (2), in which the difference between an input signal and a reference voltage signal formed in a feedback branch is a first integrator is supplied, as well as an arrangement that uses this method. The task of ensuring the stability of multi-stage incremental delta-sigma analog-to-digital converters (2) for large input signal ranges and not requiring any direct attenuation of the input signal so that direct SNR deterioration with regard to the ADC-immanent noise sources can be avoided by a virtual reference voltage is formed in the feedback branch of the incremental delta-sigma analog-digital converter, the reference voltage signal being adapted to a changing input signal range by means of an adjustable reference capacitance Cref and a clock cycle number N dependent thereon being set.
公开号:CH710379B1
申请号:CH01654/15
申请日:2015-11-13
公开日:2020-09-30
发明作者:Richter Raik;Mailand Marko
申请人:Idt Europe Gmbh;
IPC主号:
专利说明:

The invention relates to a method for setting an effective resolution of an output signal in an incremental delta-sigma analog-digital conversion by means of an incremental delta-sigma analog-digital converter, in which the difference between an input signal and a reference voltage signal formed in a feedback branch first integrator is supplied.
The invention further relates to an arrangement for incremental delta-sigma analog-to-digital conversion, the incremental delta-sigma analog-to-digital converter having a subtractor for forming a difference between an analog modulator input signal and an analog reference voltage signal and for generating a differential voltage signal (u'in), a resettable first integrator for integrating or summing the difference signal and generating a first integrator signal (u1), a quantizer for receiving the integrator signal and generating a quantization signal, the bitstream, and a digital-to-analog converter in a feedback path for Receiving the digital quantization signal and outputting the reference voltage signal to the subtractor.
The state of the art are incremental delta-sigma analog-to-digital converters (iDS-ADC) of different architecture, in which an input signal to be converted is first modulated by a modulator loop for a certain, predetermined number of clock cycles N and the digital bit stream at the output of the internal quantizer is digitally filtered. The digital filter then outputs a digital representation of the analog input signal Uin after N clock cycles.
Some methods and arrangements are known from the prior art which are used to circumvent or eliminate problems that occur when using incremental delta-sigma analog-digital converters.
In US 6,909,388 B1, for example, a method is disclosed with the aid of which the input offset of a sampled input signal for analog-to-digital (A / D) conversion using incremental delta-sigma analog-to-digital converters is isolated and can be compensated. Using a fractal algorithm, a sampling sequence is used for this purpose, by means of which the offset can be compensated for via a suitable switched capacitance. In US Pat. No. 6,909,388 B1, in addition to real-time offset compensation and the corresponding increase in the effective output dynamics of the iDS-ADC, a reduction in the flicker noise component in the output signal is also possible. In addition, the method presented in US Pat. No. 6,909,388 B1 is independent of a large number of technological process parameter spreads, e.g. resulting in component mismatch.
[0006] US 2008/0074303 A1 discloses a method for improving the stability and increasing the input voltage range in multi-stage, incremental delta-sigma analog-digital converters. At the beginning of each new AD conversion, either at least one or several integrator stages are held in the reset state and only switched on after the first loop pass according to a special scheme, or all integrator stages are initially in the reset state and become step by step per loop pass or iteration switched on. The corresponding integrator levels remain stable, as does the overall transmission of the iDS-ADC. With the reset initialization process according to US 2008/0074303 A1, it is possible to implement noise transfer functions (NTF for short) which, with larger iDS-ADC input voltage signals, may result in an unstable behavior of the ADC would have. As a result, more aggressive NTFs can be implemented or higher input voltage signal ranges can be processed with an iDS ADC. In addition, the method presented in US 2008/0074303 A1 simplifies the implementation of higher-order iDS-ADC, in particular with regard to the fulfillment of the necessary stability criteria (e.g. at high levels of the input signal). The special use of an iDS-ADC is justified in US 2008/0074303 A1, among other things, with the fact that the latency of iDS-ADCs corresponds to only about half of the baseband sample period of the connected decimation filter, whereby on the one hand individual conversions, e.g. using Successive Approximation Register (SAR) converters. This is advantageous for the use of such an ADC in those applications in which the energy requirement per conversion is in the foreground and / or in which the ADC should, can or must repeatedly go into an idle state. The latter is e.g. the case in multiplexed systems in which one and the same ADC is to process signals from different input sources. This is not possible to the same extent with classic delta-sigma analog-to-digital converters, for example, but requires more control, time and energy.
In iDS ADCs, a switch capacitance (short: SC) arrangement is often used to process the input signal to be digitized and the required reference voltage. In order to reduce so-called mismatch errors due to the capacitances used and at the same time to keep the phases (scanning and charge transfer) required for the charge transfer in such a circuit to a minimum, US 2011/0163901 A1 proposes a method in which a capacitance array by means of a suitable selection and rotating allocation of different input capacitances during an A / D conversion ultimately the mismatch influence and the gain errors can be reduced. The method proposed in US 2011/0163901 A1 relates to iDS ADCs which work using a chopped reference signal. According to US 2011/0163901 A1, the ratio of signal to reference (S / R) must therefore be less than 1 in order to ensure stability in higher-order iDS ADCs. In this context, the method described in US 2011/0163901 A1 for reducing mismatch and gain errors can be used, so to speak, in order to use the above Capacitance arrays ultimately also dampen the input signal and thus: achieve S / R <1 in terms of modulator stability in iDS ADCs with a chopped reference signal.
A specific implementation of this method is in V. Quiquempoix et al .: "A Low-Power 22-bit Incremental ADC", IEEE Journal of Solid-State Circuits, Vol. 41, No. 7, July 2006, using a 3rd order delta-sigma converter. An S / N ratio of 2/3 is aimed for in order to generate a differential input charge Qindes iDS-ADC on input capacitance Cin (depending on the input voltage Uin and the output voltage of the digital-to-analog converter (DAC ): UDAC), where Qin = Cin (2/3 • Uin-UDAC) applies. In addition to the condition that S / R must be <1 in principle, V. Quiquempoix et al. also shows that the number of clock cycles N for an A / D conversion in the iDS-ADC should be an integer multiple of the reference, in order again not to generate any new gain errors in the iDS-ADC.
DE 102011079211 B3 describes a method and its implementation as an incremental delta-sigma analog-to-digital converter, in which by means of a special minimum determination based on the internally processed quantization noise dependent on the input signal in the iDS ADC at the output of the (multi-stage) integrator stage chain the quantization error is determined. According to DE 102011079211 B3, this enables an improvement in the accuracy of the output signal or output value of the iDS-ADC. Furthermore, DE 102011079211 B3 describes that, within the framework of the method described for improving the accuracy of the ADC output value, the converter values can or should be reset before a new AD conversion. Furthermore, DE 102011079211 B3 discloses that in the method a quantization noise signal is scaled by means of a runtime-dependent coefficient in order to adapt the loop runs in the iDS ADC with the correspondingly scaled signal. This adaptation of the loop runs is primarily aimed at the highest possible accuracy of the ADC output value.
Incremental delta-sigma analog-to-digital converters typically process an analog input signal in order to assign a digital output signal which is as proportional as possible to this input signal or to implement a preferably unambiguous mapping of the analog input signal to a digital output word (FIG. 1).
As a rule, the input signal is superimposed by broadband noise (thermal noise). There are a number of ADC-inherent noise sources, such as thermal noise from resistors or recombination noise from active components with a pn junction in the ADC circuit. With delta-sigma-based converters, the output noise is often dominated by so-called quantization noise and the input noise by flicker or 1 / f noise. Due to the noise shaping within a (both classic and incremental) delta-sigma analog-digital converter, a large part of the quantization noise as well as the thermal noise NIN of the input signal can be shifted to higher frequencies by means of so-called noise shaping and filtered using a low-pass filter remove digitizing signal. However, signal components such as DC signal offsets and / or a large part of the flicker noise cannot be compensated for. FIG. 2 shows an equivalent representation of the incremental delta-sigma analog-digital converter from FIG. 1 as a time-discrete system that works in a sampled manner. The input signal noise is NIN and the noise caused by the quantization is E.
An increase in the order of the modulator in the incremental delta-sigma analog-digital converter usually results in an increase in the accuracy of the ADC output value, while at the same time the implementation effort increases and ensuring the stability of the modulator loop becomes increasingly difficult or only small loop stability reserves can be realized. This in turn leads to a higher, undesirable susceptibility to failure of the modulator loops and thus of the ADC itself. The increase in the modulator order also leads to a reduction in the input signal range that can be processed in the incremental delta-sigma analog-digital converter and thus to a reduction in the input dynamics. Incremental delta-sigma analog-to-digital converters differ from conventional delta-sigma ADCs in particular in that the integrators are reset for each new A / D conversion, and thus there is a direct mapping of an input signal value to exactly one output signal value. This is i.a. for use in multiplexed systems with several input signal sources.
Each higher-order delta-sigma modulator-based converter is limited in terms of its stability to an input signal range (dynamics) which corresponds to only part of the reference voltage used. Therefore, the input signal may have to be attenuated in order to stay safely in the stable working range of multi-stage iDS ADCs. It is typical here that the degree of attenuation with respect to the input signal increases as the modulator order increases. However, this also leads to a deterioration in the input signal level available in the ADC, which in turn either leads to a reduction in the accuracy of the digital output signal or to an increase in the signal processing effort in order to achieve the same output accuracy as such an ADC (without stability limitation). could achieve. In addition, offsets in the input signal can lead to a further reduction in the dynamics actually available for the useful signal component in the input signal. Such offsets should therefore be removed before the conversion in the iDS-ADC. Either the method from US Pat. No. 6,909,388 B1 could be used for this, or an extended dynamic range with stable ADC behavior is to be provided.
It is therefore the object of the present invention to provide an arrangement and a method by means of which the stability of multi-stage incremental delta-sigma analog-digital converters can be secured for large input signal ranges and to realize this in such a way that simultaneously a coupling of input dynamics and Stability of the modulator loop is largely avoided.
The fulfillment of this object according to the invention leads to the fact that, despite improved processable input dynamics, no direct attenuation of the input signal is required, so that direct SNR deterioration with regard to the ADC-immanent noise sources is avoided.
Another advantage of the inventive solution to the problem is that a setting of effective resolutions or accuracies with only one incremental delta-sigma analog-digital converter via a programmability of the resolution or accuracy of the incremental delta-sigma analog-digital converter allowed is.
Finally, there is a further advantage according to the invention in that higher accuracies are made possible by an optimally adaptable number of cycles control in relation to the input dynamics to be processed.
In terms of the method, the object is achieved by the method described in claim 1, a virtual reference voltage being formed in the feedback branch of the multi-stage incremental delta-sigma analog-to-digital converter, the reference voltage signal using an adjustable reference capacitance Cref via a controllable capacitance array changing input signal range and the reference capacitance Cref is set by means of a control unit and a clock cycle number N dependent on the input signal range is set by means of the control unit. This offers the advantage that the input signal of the incremental delta-sigma analog-digital converter does not have to be attenuated and there is therefore no SNR loss (signal-to-noise ratio).
The capacity array comprises variable individual capacitances that can be interconnected in series or / and parallel arrangements. As a result, the reference capacitance Cref can be optimally adapted and set in such a way that the required input dynamic range can be fully controlled and the accuracy requirements of the output signal can be met.
In a further embodiment of the proposed method, the selection of the reference capacitance Cref and the setting of the number of clock cycles N is carried out in such a way that the input signal controls the incremental delta-sigma analog-digital converter override-free as possible as possible in an operating voltage range of +/- VDD. The advantage here is that by choosing Uref or Qref, i.e. So from Cref and the clock rate N, the incremental delta-sigma analog-digital converter always allows full control of the input signal of the incremental delta-sigma analog-digital converter in the range of +/- VDD without becoming unstable. This means that the incremental delta-sigma analog-digital converter can always work stably.
According to the invention, the reference capacitance Cref and the number of clock cycles N are set by means of a control unit. The control unit monitors and controls the optimal selection of the reference capacitance from the capacitance array as well as the setting of an optimal number of clock cycles N depending on the accuracy requirements for the output signal under the condition that the incremental delta-sigma analog-digital converter remains in a stable range .
In a further embodiment of the method, the control unit controls at least two integrators of the incremental delta-sigma analog-digital converter, a quantizer and a digital-analog converter in the feedback branch. Of course, an incremental delta-sigma analog-digital converter with a higher order than the second order can also be controlled, so that the optimum selection of the reference capacitance Cref and the optimum setting of the number of clock cycles N are always made.
In one embodiment of the method according to the invention, the control unit determines and sets a measurement value that is inherent in the incremental delta-sigma analog-digital converter according to a required accuracy range of the incremental delta-sigma analog-digital converter, the set reference capacitance Cref or the other incremental delta-sigma analog-digital converter Algorithm, an optimal number of clock cycles N. The algorithm is adapted to the required accuracy range of the incremental delta-sigma analog-digital converter, the set reference capacitance Cref or the other measured values inherent in the incremental delta-sigma analog-digital converter.
In a further advantageous embodiment of the method, a single incremental delta-sigma analog-digital converter is used for multiplexed systems. For example, the increase in Uref or Qref (by means of the C1 / Cref ratio) in connection with the different number of processing cycles N allows simple, low-cost programming of the accuracy or the effective, noise-free resolution of the digital ADC output signal and the same incremental delta-sigma analog-digital converter, with maximum dynamics of the input signal, stability of the incremental delta-sigma analog-digital converter and the lowest possible number of cycles N being achievable at the same time. This ultimately results in the lowest possible energy consumption. This applies not only to systems that comprise a plurality of signals (multiplexed systems), but also to systems that potentially have to meet different requirements with regard to analog-to-digital conversion. The optimization of the energy efficiency or minimization of the energy requirement per effective LSB with a given, desired accuracy of the incremental delta-sigma analog-digital converter represents a particular advantage of the present invention.
In a further embodiment of the method, the incremental delta-sigma analog-digital converter is adapted to the accuracy requirement of an output signal. The accuracy requirement relates to the effective resolution of the ADC output signal, with effective resolutions of over 16 bits being achievable here. With previous ADC resolutions with values in the range of only 10bit to 15bit were possible. By selecting the reference capacitance Cref and setting the number of clock cycles N in the modulator loop, the accuracy of the ADC output signal can be set directly via the virtual reference with the greatest possible input dynamics. With a correspondingly adapted number of clock cycles N, one and the same iDS-ADC can be used to program or set an effective resolution for different applications.
The object is achieved on the arrangement side by the arrangement according to claim 6, a controllable capacitance array being arranged in the feedback branch, the capacitance array, the at least one integrator, the quantizer and the digital-to-analog converter in the feedback branch having a control unit are connected to control.
In one embodiment of the arrangement for incremental delta-sigma analog-digital conversion, the incremental delta-sigma analog-digital converter M has integrators. This allows the accuracy of the output signal of the incremental delta-sigma analog-digital converter to be increased. The advantage of the arrangement according to the invention, however, is that when the converter order is increased, attenuation of the input signal is no longer necessary, but the full dynamic range can be used and the conversion accuracy is increased.
In a further embodiment of the arrangement, therefore, an input signal can be fully controlled in a range of the operating voltage of +/- VDD of the incremental delta-sigma analog-digital converter independently of the number of integrators M.
In a particular embodiment of the invention, the control unit comprises a clock control logic. This enables one and the same hardware circuit of an incremental delta-sigma analog-digital converter to be adapted by means of the corresponding clock control logic, with a novel software-based scalability and improved IP reuse also becoming possible.
In general, the method according to the invention and the arrangement according to the invention offer the advantage that the delta-sigma conversion is independent of process fluctuations, since the stability and the incremental delta-sigma analog-digital converter transmission behavior do not depend on absolute circuit and capacitance values ( C1, Cref), but only on their ratio - the stability with maximum processable dynamics is ensured even with fluctuations in the manufacturing process.
[0031] It is thus possible to easily implement stably operating incremental delta-sigma analog-digital converters of a very high order.
The invention is to be explained in more detail below on the basis of exemplary embodiments. In the accompanying drawings show:<tb> Fig. 1 <SEP> Classic topology of an incremental delta-sigma analog-digital converter of the 2nd order,<tb> Fig. 2 <SEP> Incremental delta-sigma analog-digital converter of the 2nd order as a time-discrete system with noise equivalent input and output noise sources,<tb> Fig. 3 <SEP> precision-programmable incremental delta-sigma analog-digital converter 2nd order with virtual reference voltage generation,<tb> Fig. 4 <SEP> generalized iDS-ADC input stage, shown is a first integrator of the modulator chain for differential input signals with a capacitance array for generating the programmable, virtual reference voltage;<tb> Fig. 5 <SEP> principle topology for the capacitance array for programming the virtual reference voltage and<tb> Fig. 6 <SEP> Generalized, precision-programmable incremental delta-sigma-analog-digital converter of any order i with virtual reference voltage generation.
3 shows an accuracy-programmable incremental delta-sigma analog-digital converter of the 2nd order with virtual reference voltage generation. In almost every analog-to-digital converter, including iDS ADCs, a reference signal is required by means of which it is determined how large an individual digitization step, ULSB or. a Least Significant Bit (LSB), or the processable input signal range. Such ADCs are often implemented as electronic circuits in which the reference signal is a voltage Uref and the input signal is also a voltage Uin. The integrating behavior of the modulator stages is usually achieved by means of charge storage and processing depending on Uin and Uref. For a typical iDS ADC input stage, i.e. an integrating amplifier 3, the stored input charge Q is proportional to the difference between the input and feedback signal UDAC, UDAC in turn being dependent on Uref, and Qin is also proportional to the input capacitance C1. Hence: Qin∼ C1 • (Uin-UDAC). For a given operating voltage VDD of the incremental delta-sigma analog-digital converter 1, it must be ensured in terms of the stability of the modulator loop that the internal partial voltages in the incremental delta-sigma analog-digital converter 1 remain small enough. In order not to cause any direct attenuation of the input signal Uin with a simultaneous loss of the signal-to-noise ratio, UDAC or. Uref increased. This increase means that the central signal term (Uin - UDAC) remains small enough for stable operation of the delta-sigma modulator in the incremental delta-sigma analog-digital converter 1.
Fig. 4 shows the first integrator 3 of an incremental delta-sigma analog-digital converter 1. The input charge of the iDS-ADC is composed as follows:<tb> <SEP> Qin = C1 • Uin- Cref • Uref, whereby the differential voltages result from the specified individual signals as follows: 2 * Uin = U <+> in- U <-> and 2 * Uref = U < +> ref- U <-> ref.
The input signal range of Uink can be maximum with respect to the operating voltage VDD, i.e. Uin∈ [-VDD, + VDD]. To maintain the stability of the modulator loop, the reference charge Qref = Cref • Uref, which is dependent on the reference voltage Uref, is increased by means of the capacitance Cref. A virtual reference voltage signal therefore acts in the incremental delta-sigma analog-digital converter 1, which does not depend on the absolute levels of the input and reference voltage, but is controlled directly by means of the capacitance ratio C1 / Cref. The digitization range and the usable input dynamics are thus mapped to the range -Qref to + Qref. Here, a larger Qref is synonymous with a larger virtual reference voltage with the operating voltage VDD assumed to be constant. This ultimately leads to an increase in the step size ULSB, which with a corresponding increase in the number of clock cycles N, i.e. the loop runs for an A / D conversion in the iDS-ADC is implemented. The selection of Cref and the setting of the associated number of clock cycles N are carried out via a suitable control unit (see FIGS. 3 and 6).
5 shows a simple capacitance array 10 on the first integrator 3. By selecting the Cref and setting the number of clock cycles N in the modulator loop, the accuracy of the ADC output signal can be set directly via the virtual reference with the greatest possible input dynamics. With a correspondingly adapted number of clock cycles N, one and the same iDS-ADC can be used to program or set an effective resolution for different applications.
FIG. 6 shows an incremental delta-sigma analog-digital converter 1 with an arbitrarily high order. For such complex applications, the number of clock cycles N can be determined as a function of the ratio C1 / Cref either in the context of the design process by means of a suitable algorithm, with the different, Cref-dependent, adjustable clock cycle numbers N in one circuit, e.g. are stored in a memory or as a hard-wired circuit. Or the control unit 9 (see also FIG. 3) additionally implements a suitable algorithm which, depending on the (externally) desired ADC accuracy, the set reference capacitance Cref 11 and possibly other current iDS-ADC-inherent measured values determines and sets optimal and suitable number of clock cycles N, the hardware expenditure being constant.
This makes it possible to operate incremental delta-sigma analog-digital converters with a very high order in a signal-technically stable range without having to reduce the input dynamics by attenuating the input signals.
List of reference symbols
1 incremental delta-sigma analog-digital converter 2 comparator or quantizer 3 integrator 4 differentiator 5 digital-to-analog converter (DAC) 6 bitstream 7 digital filter 8 feedback branch 9 control unit 10 controllable capacitance array 11 reference capacitance 12 number of clock cycles N.
权利要求:
Claims (9)
[1]
1. A method for setting an effective resolution of an output signal in an incremental delta-sigma analog-digital conversion by means of a multi-stage incremental delta-sigma analog-digital converter (1), with a first integrator (3) of the incremental delta-sigma-analog The difference between an input signal and a reference voltage signal formed in a feedback branch (8) is fed to the digital converter (1), characterized in that a virtual reference voltage is formed in the feedback branch (8) of the incremental delta-sigma analog-to-digital converter (1), the reference voltage signal being adapted to a changing input signal range by means of an adjustable reference capacitance Cref (11) via a controllable capacitance array (10) and the reference capacitance Cref (11) being set by means of a control unit (9), as well as a number of clock cycles N (depending on the input signal range) 12) is set using the control unit (9).
[2]
2. The method according to claim 1, characterized in that the setting of the reference capacitance Cref (11) and the setting of the number of clock cycles N (12) takes place in such a way that the input signal is in an operating voltage range of +/- VDD the incremental delta-sigma analog -Digital converter (1) maximum possible without overdrive and thus fully modulates.
[3]
3. The method according to claim 1 or 2, characterized in that the control unit (9) has at least two integrators (3) of the incremental delta-sigma-analog-digital converter (1), a quantizer (2) and a digital-analog Converter (5) in the feedback branch (8) controls.
[4]
4. The method according to any one of the preceding claims, characterized in that the control unit (9), based on a required accuracy range of the incremental delta-sigma analog-digital converter (1), the set reference capacitance Cref (11) or the other incremental delta-sigma analog-digital converter inherent measurement values implements a suitable algorithm that determines and sets an optimal number of clock cycles N (12).
[5]
5. The method according to any one of the preceding claims, characterized in that a single incremental delta-sigma analog-digital converter (1) is used for multiplexed systems.
[6]
6. Arrangement for carrying out the method according to one of claims 1 to 5, wherein the multi-stage incremental delta-sigma-analog-digital converter (1) has a difference generator (4) for forming a difference between an analog modulator input signal and an analog reference voltage signal and for Generating a differential voltage signal (u'in), a resettable first integrator (3) for integrating or summing the differential signal and generating a first integrator signal (u1), a quantizer (2) for receiving the integrator signal and generating a quantization signal, and a digital-analog -Converter (5) in a feedback branch (8) for receiving the digital quantization signal and outputting the reference voltage signal to the subtractor (4), characterized in that a controllable capacitance array (10) is arranged in the feedback branch (8), the capacitance array (10), the at least one integrator (3), the quantizer (2) and d he digital-to-analog converter (5) in the feedback branch (8) are connected to a control unit (9) in a controlling manner.
[7]
7. Arrangement according to claim 6, characterized in that the incremental delta-sigma analog-digital converter (1) has M integrators (3), where M is an integer positive number.
[8]
8. Arrangement according to claim 6 or 7, characterized in that an input signal can be fully modulated in a range of the operating voltage of +/- VDD of the incremental delta-sigma-analog-digital converter (1) regardless of the number of integrators (3).
[9]
9. Arrangement according to one of claims 6 to 8, characterized in that the control unit (9) has a clock control logic for determining and setting the optimal number of clock cycles N (12) for adapting one and the same hardware circuit of the incremental delta-sigma analog-to-digital converter (1) includes.
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同族专利:
公开号 | 公开日
DE102014116599A1|2016-05-19|
JP2016096543A|2016-05-26|
JP6518571B2|2019-05-22|
US9379734B2|2016-06-28|
DE102014116599B4|2021-04-22|
KR20160057330A|2016-05-23|
CH710379A2|2016-05-13|
CN105634495B|2018-10-19|
CN105634495A|2016-06-01|
KR102104925B1|2020-04-27|
US20160142072A1|2016-05-19|
引用文献:
公开号 | 申请日 | 公开日 | 申请人 | 专利标题

JPH0779243B2|1987-04-10|1995-08-23|日本電気株式会社|Oversample type A / D converter|
JPH0779243A|1993-07-13|1995-03-20|Hitachi Ltd|Network connection device and network connection method|
US6037887A|1996-03-06|2000-03-14|Burr-Brown Corporation|Programmable gain for delta sigma analog-to-digital converter|
DE102004009611B4|2004-02-27|2010-01-14|Infineon Technologies Ag|Time-continuous sigma-delta analog-to-digital converter|
US6909388B1|2004-06-23|2005-06-21|Microchip Technology Incorporated|Fractal sequencing schemes for offset cancellation in sampled data acquisition systems|
WO2006008207A1|2004-07-17|2006-01-26|Robert Bosch Gmbh|Sigma-delta modulator|
US7295140B2|2005-07-13|2007-11-13|Texas Instruments Incorporated|Oversampling analog-to-digital converter and method with reduced chopping residue noise|
US7176819B1|2005-09-08|2007-02-13|Agilent Technologies, Inc.|Precision low noise-delta-sigma ADC with AC feed forward and merged coarse and fine results|
TWI312619B|2006-07-26|2009-07-21|Ite Tech Inc|Delta-sigma analog to digital converter and method thereof|
US7375666B2|2006-09-12|2008-05-20|Cirrus Logic, Inc.|Feedback topology delta-sigma modulator having an AC-coupled feedback path|
US7446686B2|2006-09-22|2008-11-04|Cirrus Logic, Inc.|Incremental delta-sigma data converters with improved stability over wide input voltage ranges|
DE102006058011B3|2006-12-08|2008-07-17|Infineon Technologies Ag|Concept for reading out an analogue sensor output signal|
JP4939497B2|2008-08-27|2012-05-23|ルネサスエレクトロニクス株式会社|ΔΣ type analog-digital converter|
US7825838B1|2008-09-05|2010-11-02|National Semiconductor Corporation|Capacitor rotation method for removing gain error in sigma-delta analog-to-digital converters|
US7852248B1|2008-12-09|2010-12-14|Alvand Technology, Inc.|Analog-to-digital converter with reduced jitter sensitivity and power consumption|
CN101640539B|2009-06-19|2013-04-10|浙江大学|Sigma-delta analog-to-digital converter|
WO2012005777A1|2010-07-08|2012-01-12|Microchip Technology Incorporated|2-phase gain calibration and scaling scheme for switched capacitor sigma-delta modulator using a chopper voltage reference|
CN101917198A|2010-08-05|2010-12-15|复旦大学|High-speed low-power-consumption continuous-time sigma-delta modulator|
DE102011079211B3|2011-07-14|2012-12-20|Technische Universität Dresden|Method for performing incremental delta-sigma analog-to-digital conversion in digital transducer, involves performing adjustment of conversion period based on determined optimum output value|
US8451051B2|2011-10-04|2013-05-28|Issc Technologies Corp.|Dual mode sigma delta analog to digital converter and circuit using the same|
GB2507332B|2012-10-26|2016-09-14|Cirrus Logic Int Semiconductor Ltd|Digital/analogue conversion|US9859914B1|2016-08-05|2018-01-02|Mediatek Inc.|Delta-sigma modulator with delta-sigma truncator and associated method for reducing leakage errors of delta-sigma modulator|
EP3526598A1|2016-10-28|2019-08-21|Siemens Aktiengesellschaft|Gas chromatographdetector to provide gc measurement in digital form|
US10327659B2|2016-11-13|2019-06-25|Analog Devices, Inc.|Quantization noise cancellation in a feedback loop|
CN108173549A|2017-12-19|2018-06-15|重庆湃芯微电子有限公司|A kind of low-power consumption sigma delta modulators based on capacitance resistance double loop structure|
CN108832931B|2018-05-24|2022-02-11|东南大学|Delta-Sigma modulator using externally applied perturbation signal|
US10720939B2|2018-06-12|2020-07-21|Asahi Kasei Microdevices Corporation|Delta-sigma ad converter and delta-sigma ad converting method|
法律状态:
2018-11-30| PFA| Name/firm changed|Owner name: IDT EUROPE GMBH, DE Free format text: FORMER OWNER: ZENTRUM MIKROELEKTRONIK DRESDEN AG, DE |
优先权:
申请号 | 申请日 | 专利标题
DE102014116599.3A|DE102014116599B4|2014-11-13|2014-11-13|Method and arrangement for setting an effective resolution of an output signal in incremental delta-sigma analog digital converters|
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